The interview was related to the research article published in the journal Applied Optics of the Optical Society of America. Eva M. Valero and Miguel Ángel Martínez explain the advantages of the new design they propose for a multispectral imaging sensor based in the cut-edge imaging technology still under development of Transverse Field Detectors. they explain about possible applications, novelties and main interests of this research. The interview was recorded at the Color Imaging Laboratory dependencies in January 2015.

The research article can be downloaded here.

More info about the interview here.

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